Dr. Edmundo A. Gutierrez obtained his Ph.D. in 1993 from the Katholieke Universiteit Leuven (Belgium), specializing in submicron CMOS technologies for cryogenic applications. He held executive positions as Design Manager at the Semiconductor Technology Center of Motorola Mexico and Technical Director of the Systems Research Center of Intel Mexico. He is currently Director General of INAOE, Editor-in-Chief of IEEE Transactions on Device and Materials Reliability and IEEE Fellow member. He has published more than 160 scientific articles, is the author of two books and has supervised 17 doctoral theses.